Applied Materials’ David Thompson shares the new DARPA program that is focused on using correlated electrons to develop a new type of switch with quantum effects, potentially leading to unprecedented switching speeds.
Mentor’s Joe Hupcey III argues that for the most effective formal analysis, assertions should be as simple as possible and shares some tips on decomposing big assertions.
Cadence’s Paul McLellan listens in as a panel of experts discusses how embedded speculative execution is in the way programming is now done and what Spectre and Meltdown mean for secure design.
Synopsys’ Taylor Armerding notes that while the security of connected medical devices should start improving thanks to the FDA’s adoption of UL 2900-2-1 for better software security, it doesn’t change much yet.
SEMI’s Christian G. Dieseldorff investigates how much new fabs and lines are spending on equipment, with a fourth consecutive year of growth in fab construction predicted.
Intel’s Ron Wilson examines the challenges of Network Functions Virtualization, which areas have shown the most interest in it, and the possibilities for it outside the worlds of networking and communications.
Arm’s Charlotte Christopherson points to highlights from this week’s Arm Research Summit and how to watch videos of the whole event.
A Rambus writer considers some of the potential negative impacts of smart cities, from greater surveillance to irresponsible cities selling citizen’s data to third-party advertisers.
Samsung’s Vinodh Poyyapakkam notes that rather than leveling off with the saturation of smartphones, CMOS image sensor growth is set to continue thanks to the automotive market.
Lam Research’s Shelly Miyasato looks back at the rapid progress made since the integrated circuit was invented 60 years ago.
And don’t forget to check out the blogs featured in last week’s Low Power-High Performance newsletter :
Editor In ChiefEd Sperling contends that just building systems based on speed now comes with a well-publicized risk.
Mentor’sProgyna Khondkar finds that low power coverage remains a missing piece of the functional verification environment.
Cadence’sMarc Swinnen observes that at the latest nodes, it is becoming impossible to analyze IR drop correctly.
Fraunhofer’sJens Michael Warmuth examines the current state and future development of a key concept for reliability assessment.
Moortec’sRamsay Allen argues that from identifying hot spots to individualizing optimization schemes, it’s important to know what’s going on inside a chip.
Synopsys’Dana Neustadter looks at where security is needed in AI environments.
Arm’sBrian Fuller zeroes in on the growing focus on functional safety in autonomous and semi-autonomous vehicles.
Helic’s Nikolas Provatas and Magdy Abadir consider how to improve reliability, trim manufacturing costs, and shorten time to market with electromagnetic analysis.